As a business and technology fellow, Rahman Jamal works across the company on key business and technology-driven initiatives. He consults with executive leaders to drive the company’s strategic direction, development, and future growth.

Since joining NI in 1990, Jamal has held leading positions in Application Engineering and Marketing. He has extensive knowledge and experience in all the major markets and industries served by NI, including test and measurement, design and control, industrial and embedded, automotive, and academia.

Jamal is a thought leader in many public forums on innovation policy – such as the IIoT, Industrie 4.0, TSN and other technologies influencing the future of engineering. He also frequently acts as a company spokesperson, communicating the company’s strategy to customers, partners, investors, and employees.

Jamal earned a master’s degree in electrical engineering from the University of Paderborn, Germany. Only recently, Jamal was appointed to “visiting professor” for Industrie 4.0 and IIoT at the Sino-German College for Applied Sciences at Tongji University, Shanghai, China.

The proliferation of the IoT/IIoT, the progression of 5G technology from prototyping to commercial deployment, and the journey to autonomous driving for the masses are fundamentally transforming industries, product testing, and the companies trying to monetize them. These engineering megatrends all present large and complex challenges, but they also give us the opportunity to innovate in ways we never could have imagined. For example, applying IoT capabilities such as systems management, data management, visualization and analytics, and application enablement to the automated test workflow can better equip test engineers to overcome the challenges of the IoT.

Truly realizing the benefits of these megatrends requires a fundamental shift in our approach to automated test and automated measurement. To be successful, we must think differently, act purposefully, and make the critical shift toward software-defined systems.